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Proton Cross-Sections from Heavy-Ion Data in Deep-Submicron Technologies

Proton Cross-Sections from Heavy-Ion Data in Deep-Submicron Technologies

This paper reports on the calculation of proton SEU cross section from heavy-ion data using a number of different models. Model accuracy is checked using data on proton
and heavy-ion cross sections from the published literature. The closed-form models developed with earlier semiconductor devices typically overestimated the proton cross section, and the difference increased with smaller feature sizes. The results emphasize that low LET heavy-ion data is crucial in determining the proton upset cross section.